Follow
Scanning Electron Microscope (SEM)
A Scanning Electron Microscope (SEM) is a powerful magnification tool that utilizes focused beams of electrons to obtain information. This surface imaging method is fully able to monitor size, size distribution, formation, and morphology of synthesized micro and nano structures.
-
FEB 07, 2019 | 8:00 AM
Date: February 7, 2019Time: 8:00am PST, 11:00am EST Modern microscopes are becoming increasingly complex instruments enabling registration of image sets far beyon...
FEB 07, 2019 | 8:00 AM
Date: February 7, 2019Time: 8:00am PST, 11:00am EST Modern microscopes are becoming increasingly complex instruments enabling registration of image sets far beyon...