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Cryoelectron Microscopy
TEMs (Transmission electron microscopes) pass a beam of electrons through a sample to create an image of that sample onto a detector. However, these electron beams can cause water around a sample to evaporate, and the sample can become burned and/or destroyed. Cryoelectron microscopy, also known as Cryo-EM, utilizes frozen samples and less intense electron beams coupled with advanced imaging, to prevent molecular damage and destruction during this process.
